Atomic Force Microscopy (AFM) is a scanning probe technique offering a wide range of applications. This modality allows the measure of stiffness, elasticity, volume or topology of a variety of samples. The Orion Scanning Probe facility has an AFM microscope coupled to a fluorescent widefield microscope, allowing a perfect correlation between the fluorescent signal and the AFM measures.

AFM JPK / Apotome Axio Observer Zeiss

  • AFM NanoWizard 4 (JPK)
  • Axio Observer Zeiss with Apotome module
  • Hamamatsu SCMOS Flash 4.0 Camera

Managed by:

Tristan Piolot