Atomic Force Microscopy (AFM) is a scanning probe technique offering a wide range of applications. This modality allows the measure of stiffness, elasticity, volume or topology of a variety of samples. The Orion Scanning Probe facility has an AFM microscope coupled to a fluorescent widefield microscope, allowing a perfect correlation between the fluorescent signal and the AFM measures.
AFM JPK / Apotome Axio Observer Zeiss
- AFM NanoWizard 4 (JPK)
- Axio Observer Zeiss with Apotome module
- Hamamatsu SCMOS Flash 4.0 Camera
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